Probe option
Upright microscope type
The sample is placed on a table and the probe beam is emitted downward from an objective lens on top for measurement.
![](https://www.skytechnology.co.jp/wordpress/wp-content/uploads/HP_プローブ_正立.png)
Inverted microscope type
The sample is placed on a table and the probe beam is emitted upward from an objective lens below.
![](https://www.skytechnology.co.jp/wordpress/wp-content/uploads/HP_プローブ_倒立.png)
Fixed arm type
The rotary mechanism allows measurement by emitting the probe beam from any angle, and the fine adjustment mechanism in the horizontal and vertical directions on the OCT image makes it easy to fine-tune the measurement target position. It is suitable for precise final position adjustment.
![](https://www.skytechnology.co.jp/wordpress/wp-content/uploads/HP_プローブ_固定アーム-1.png)
Free arm type
The probe beam can be emitted from any angle for measurement. Any arbitrary point can be measured quickly.
![](https://www.skytechnology.co.jp/wordpress/wp-content/uploads/HP_プローブ_フリーアーム.png)